Background Rejection in Two-Photon Fluorescence Image Scanning Microscopy
Publication Name
Photonics
Abstract
We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy and image scanning microscopy. The resolution, optical sectioning and background rejection are all improved over nonconfocal two-photon microscopy. Replacing the pinhole of confocal two-photon microscopy with a detector array increases the peak intensity of the point spread function. The outer pixels of a detector array give signals from defocused regions, and thus the processing of these, such as through subtraction, can further improve optical sectioning and background rejection.
Open Access Status
This publication may be available as open access
Volume
10
Issue
5
Article Number
601