Direct observation of nanoscale dynamics of ferroelectric degradation

Authors

Qianwei Huang, The University of Sydney
Zibin Chen, The University of Sydney
Matthew J. Cabral, The University of Sydney
Feifei Wang, Shanghai Normal University
Shujun Zhang, University of Wollongong
Fei Li, Xi'an Jiaotong University
Yulan Li, Pacific Northwest National Laboratory
Simon P. Ringer, The University of Sydney
Haosu Luo, Shanghai Institute of Ceramics Chinese Academy of Sciences
Yiu Wing Mai, The University of Sydney
Xiaozhou Liao, The University of Sydney

Publication Name

Nature Communications

Abstract

Failure of polarization reversal, i.e., ferroelectric degradation, induced by cyclic electric loadings in ferroelectric materials, has been a long-standing challenge that negatively impacts the application of ferroelectrics in devices where reliability is critical. It is generally believed that space charges or injected charges dominate the ferroelectric degradation. However, the physics behind the phenomenon remains unclear. Here, using in-situ biasing transmission electron microscopy, we discover change of charge distribution in thin ferroelectrics during cyclic electric loadings. Charge accumulation at domain walls is the main reason of the formation of c domains, which are less responsive to the applied electric field. The rapid growth of the frozen c domains leads to the ferroelectric degradation. This finding gives insights into the nature of ferroelectric degradation in nanodevices, and reveals the role of the injected charges in polarization reversal.

Open Access Status

This publication may be available as open access

Volume

12

Issue

1

Article Number

2095

Funding Number

DP190101155

Funding Sponsor

Australian Research Council