Multiple fault diagnosis using psycho-clonal algorithms
RIS ID
45450
COinS
45450
Publication Details
Shukla, N. & Prakash, P. (2011). Multiple fault diagnosis using psycho-clonal algorithms. In M. Tiwari & J. A. Harding (Eds.), Evolutionary computing in advanced manufacturing (pp. 235-258). Hoboken, N.J: Wiley.