RIS ID

138738

Publication Details

Wu, C., Sun, L. & Zhou, Z. (2019). The impact of a dot: Case studies of a noise metamorphic relation pattern. Proceedings - 2019 IEEE/ACM 4th International Workshop on Metamorphic Testing, MET 2019 (pp. 17-23). United States: IEEE.

Abstract

We propose a 'noise' metamorphic relation pattern (MRP), which is a sub-pattern under the more general MRP 'symmetry.' We conduct case studies with real-life systems in three different application domains (obstacle perception in autonomous systems, machine translation, and named entity recognition) to show the usefulness of the 'noise' MRP for software verification and validation.

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Link to publisher version (DOI)

http://dx.doi.org/10.1109/MET.2019.00011