Investigation of ultrasmall 1 x N AWG for SOI-Based AWG demodulation integration microsystem

Authors

Hongqiang Li, Tianjin Polytechnic UniversityFollow
Wentao Gao, Tianjin Polytechnic University
Enbang Li, University of WollongongFollow
Chunxiao Tang, Tianjin Polytechnic University

RIS ID

105703

Publication Details

Li, H., Gao, W., Li, E. & Tang, C. (2015). Investigation of ultrasmall 1 x N AWG for SOI-Based AWG demodulation integration microsystem. IEEE Photonics Journal, 7 (6), 7802707-1-7802707-8.

Abstract

Optoelectronic integration technologies based on silicon-on-insulator (SOI) can bring revolutionary change to on-chip arrayed waveguide grating (AWG) demodulation systems. In this study, we present several ultrasmall 1 x N AWGs for an SOI-based AWG demodulation integration microsystem of different scales. The core sizes of the fabricated AWGs are smaller than 400 x 600 μm2. Experimental results match the simulation results, indicating that AWGs have a good transmission spectrum of low crosstalk below -20 dB and low insertion loss below -6.5 dB. The fabricated AWGs can be perfectly applied to improve the integration level and performance of the SOI-based AWG demodulation integration microsystem.