Characterisation of amorphous silica in air-oxidised Ti3SiC2 at 500-1000 degrees Celcius using secondary-ion mass spectrometry, nuclear magnetic resonance and transmission electron microscopy

Authors

Wei Kong Pang, University of WollongongFollow
It-Meng Low, Curtin University of Technology
John V. Hanna, ANSTO, University of Warwick

RIS ID

88682

Publication Details

Pang, W. K., Low, I. M. & Hanna, J. V. (2010). Characterisation of amorphous silica in air-oxidised Ti3SiC2 at 500-1000 degrees Celcius using secondary-ion mass spectrometry, nuclear magnetic resonance and transmission electron microscopy. Materials Chemistry and Physics, 121 (3), 453-458.

Abstract

In this paper we have described the use of secondary-ion mass spectrometry (SIMS), solid state 29Si magic-angle-spinning (MAS) numclear magnetic resonance (NMR) and transmission electron microscopy (TEM) to detect the existence of amorphous silica in Ti3-SiC2 oxidised at 500-1000 degrees celcius.