Kumar, A., Baker, J., Cabral, M., Bowes, P., Zhang, S., Dickey, E., Irving, D. & LeBeau, J. (2020). Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior. Microscopy and Microanalysis,
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Publication Details
Kumar, A., Baker, J., Cabral, M., Bowes, P., Zhang, S., Dickey, E., Irving, D. & LeBeau, J. (2020). Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior. Microscopy and Microanalysis,