An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor

Authors

Na Li, Tsinghua University
Zhi Li, Chinese Academy of SciencesFollow
Hao Ding, Tsinghua University
Shuaihua Ji, Tsinghua University
Xi Chen, Tsinghua University
Qi-Kun Xue, Tsinghua UniversityFollow

RIS ID

115201

Publication Details

Li, N., Li, Z., Ding, H., Ji, S., Chen, X. & Xue, Q. (2013). An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor. Applied Physics Express, 6 113101-1-113101-4.

Abstract

The single-layer iron selenide (FeSe) superconductor is becoming an ideal system to study the mechanism of high-temperature superconductivity. In this work, we use atomic force microscopy (AFM) to demonstrate that: (1) unidirectional stripe in the single-layer FeSe film is purely an electronic feature instead of lattice reconstruction; (2) the charge transfer from the SrTiO3 substrate to FeSe plays an important role in inducing superconductivity in single-layer FeSe. Both short-range and long-range forces are exploited in the study. The combination of AFM with scanning tunneling microscopy opens a new opportunity to investigate the mechanism of high-Tc materials.