Ce2Y2O7and Ce0.8Zr0.2O2 buffer layers deposited by E-beam evaporation

Authors

Dongqi Shi, University of WollongongFollow
Jung Ho Kim, University of WollongongFollow
M Y. Zhu, Shanghai University, China
S X. Dou, University of WollongongFollow

RIS ID

21837

Publication Details

Shi, D, Kim, J, Zhu, M & Dou, SX (2007), Ce2Y2O7and Ce0.8Zr0.2O2 buffer layers deposited by E-beam evaporation, Physica C: Superconductivity and its Applications, 460-462 (Part 2), pp. 1394-1396.

Abstract

CeO₂ has been widely used for buffer layers of YBCO coated conductor, however, CeO₂ cannot be used as a single buffer layer to achieve a high J_c. Films of Ce₂Y₂O₇ and Ce_0.8Zr_0.2O₂ were deposited by electron-beam evaporation on biaxially textured Ni3%W substrates as single buffer layers. It was confirmed that controlling the deposition temperature could control the texture of the films. For the Ce₂Y₂O₇, a pure c-axis texture can be obtained on Ni3%W. For the Ce_0.8Zr_0.2O₂there is still a small (1 1 1) peak, indicating some lack of pure c-axis orientation, even if the deposition temperature is high. XRD θ-2θ scans and Ø-scans were employed to examine the texture. It is suggested that biaxially textured Ce₂Y₂O₇ films are good potential candidates for a single buffer layer.