Study on Generalized Analysis Model for Fringe Pattern Profilometry

Authors

Y. Hu, University of WollongongFollow
Jiangtao Xi, University of WollongongFollow
Z. Yang, Huazhong University of Science and Technology, China
Enbang Li, Univeristy of WollongongFollow
Joe F. Chicharo, University of WollongongFollow

RIS ID

25579

Publication Details

This article was originally published as Hu, Y, Xi, J, Yang, Z, Li, E and Chicharo, JF, Study on Generalized Analysis Model for Fringe Pattern Profilometry, IEEE Transactions on Instrumentation and Measurement, 57(1), 2008, 160-167. Copyright IEEE 2008.

Abstract

This paper presents a generalized analysis model for fringe pattern profilometry. We mathematically derived a new analysis model that gives a more general expression of the relationship between projected and deformed fringe patterns. Meanwhile, based on the proposed generalized model, a new algorithm is presented to retrieve 3-D surfaces from nonlinearly distorted fringes.Without any prior knowledge about the projection system, we still can obtain very accurate measurement results by using a generalized analysis model and a proposed algorithm. Computer simulation and experimental results show that the generalized model and the proposed algorithm can significantly improve the 3-D reconstruction precision, especially when the projected fringe pattern is nonlinearly distorted.