Estimating the parameters of semiconductor lasers based on weak optical feedback interferometry

Authors

Jiangtao Xi, University of WollongongFollow
Yanguang Yu, University of WollongongFollow
Joe F. Chicharo, University of WollongongFollow
Thierry Bosch, Zhengzhou University

RIS ID

13264

Publication Details

Xi, J., Yu, Y., Chicharo, J. F. & Bosch, T. (2005). Estimating the Parameters of Semiconductor Lasers Based on Weak Optical Feedback Interferometry. In A. Rakic & Y. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices COMMAD04 Proceedings (pp. 401-404). USA: IEEE.

Abstract

The paper presents a new approach for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SL) and the optical feedback level factor C in SLs. The proposed approach is based on the analysis of self-mixing signals observed in self-mixing optical feedback interferometry. Unlike existing approaches, the approach tries to estimate the parameters LEF and C by a gradient-based optimization algorithm that achieves best data-to-theoretical model fitting. The effectiveness and accuracy of the method have been confirmed and tested by theoretical analysis and computer simulations.