Publication Details

This article was originally published as Cheng, Z, Wang, X, Kannan, CV, Ozawa, K, Kimura, H, Nishida, T, Zhang, S & Shrout, TR, Enhanced electrical polarization and ferromagnetic moment in a multiferroic BiFeO3/Bi3.25Sm0.75Ti2.98V0.02O12 double-layered thin film, Applied Physics Letters, 2006, 88, 132909. Original journal available here.


Multiferroic BiFeO3/Bi3.25Sm0.75Ti2.98V0.02O12 double-layered thin films on Pt/Ti/SiO2/Si were fabricated using the pulsed-laser deposition technique. The films showed greatly enhanced ferroelectric and ferromagnetic properties. The values of the remanent polarization (2Pr) and coercive field (Ec) were 71.8 µC/cm2 and 148 kV/cm at a maximum applied voltage of 13 V, respectively. The value of the magnetic moment was found to be 17.5 emu/cm3. The enhancement of the polarization originated from the BiFeO3 with Bi3.25Sm0.75Ti2.98V0.02O12 working as a barrier layer. The enhancement of the magnetization is from the structural distortion of BiFeO3, due to partial epitaxial growth on the bismuth titanate surface.

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