Title

A Testing Tool for Machine Learning Applications

RIS ID

146062

Publication Details

Liu, Y., Liu, Y., Chen, T. & Zhou, Z. (2020). A Testing Tool for Machine Learning Applications. Proceedings - 2020 IEEE/ACM 42nd International Conference on Software Engineering Workshops, ICSEW 2020 (pp. 386-387). New York, United States: Association for Computing Machinery.

Abstract

© 2020 ACM. We present the design of MTKeras, a generic metamorphic testing framework for machine learning, and demonstrate its effectiveness through case studies in image classification and sentiment analysis.

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Link to publisher version (DOI)

http://dx.doi.org/10.1145/3387940.3392694