Title

Alpha Measurement Using Laser Dynamics

RIS ID

133612

Publication Details

Y. Ruan, B. Liu, Y. Yu, J. Xi, Q. Guo & J. Tong, "Alpha Measurement Using Laser Dynamics," in IFCS 2018 - IEEE International Frequency Control Symposium, 2018, pp. 1-4.

Abstract

The linewidth enhancement factor (alpha) is an important parameter for a semiconductor laser (SL). This paper presents a new method for measuring alpha by using the dynamics of an SL with optical feedback. A self-mixing interferometry (SMI) configuration is used to implement the proposed method. The relaxation oscillation (RO) of an SL with optical feedback carries the information of alpha. Staring from the well-known Lang-Kobayashi (L-K) equations, we investigated the transient behavior of an SL with external optical feedback, and the relationship between SL' \mathbf{s} RO frequency and alpha. By applying FFT on the transient waveform, the RO frequency can be obtained and further used to calculate alpha. This work provides a new technique to the area of alpha measurement.

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Link to publisher version (DOI)

http://dx.doi.org/10.1109/FCS.2018.8597542