On the relationships between surface profile height parameters
It is shown that reliable estimates of the currently measured "general" surface profile height parameters can be made given a knowledge of the r.m.s. roughness, skewness and kurtosis of the profile since these three statistical parameters collectively define the distribution of surface heights to an adequate degree. "Extreme value" parameters (such as Rt and Rp) are also discussed and it is shown that they can also be estimated if information about the correlation structure of the profile is available. ?? 1982.