Edge-on face-to-face MOSFET for synchrotron microbeam dosimetry: MC modeling
journal contribution
posted on 2024-11-15, 10:14 authored by Anatoly RozenfeldAnatoly Rozenfeld, E A Siegbahn, E Brauer-Krisch, A Holmes-Siedle, Michael LerchMichael Lerch, A Bravin, Iwan CorneliusIwan Cornelius, George TakacsGeorge Takacs, N Painuly, H Nettleback, T KronThe dosimetry of X-ray microbeams using MOSFETs results in an asymmetrical beam profile due to a lack of lateral charged particle equilibrium. Monte Carlo simulations were carried out using PENELOPE and GEANT4 codes to study this effect and a MOSFET on a micropositioner was scanned in the microbeam. Based on the simulations a new method of microbeam dosimetry is proposed. The proposed edge-on face-to-face (EOFF) MOSFET detector, a die arrangement proposed here for the first time, should alleviate the asymmetry. Further improvement is possible by thinning the silicon body of the MOSFET.