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Material characterization at low frequencies using THz and Raman spectroscopy

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conference contribution
posted on 2024-11-15, 13:20 authored by Y Kutuvantavida, G V M Williams, Elise Pogson, D Bhuiyan, K Radhanpura, Roger LewisRoger Lewis
We present results from wideband THz, low wave-number Raman, and FTIR measurements on benzoic acid and two of its derivatives. The low energy vibrational modes have been identified and compared with the results from calculations.

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Citation

Kutuvantavida, Y., Williams, G. V M., Pogson, E. M., Bhuiyan, D., Radhanpura, K. & Lewis, R. A. (2012). Material characterization at low frequencies using THz and Raman spectroscopy. 37th IRMMW-THz: International Conference on Infrared, Millimeter, and Terahertz Waves (pp. 1-3). IEEE Xplore: IEEE.

Parent title

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz

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Language

English

RIS ID

75377

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    thzfrequencieslowspectroscopycharacterizationramanmaterial

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