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Far-infrared spectroscopy of P ion-implanted Si

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conference contribution
posted on 2024-11-13, 13:51 authored by Roger LewisRoger Lewis, Nik Stavrias, Steven Prawer, Paul Spizzirri
The spectroscopy of impurity atoms in elemental Si has a long history and has received a fillip in recent years with the development of the Kane quantum computer. In this study we report on one method of incorporating P (and P dimers) into the semiconductor host lattice, namely iron-implantation, and one method of analysing for the impurity, namely far-infrared magnetospectroscopy.

History

Citation

Lewis, R. A., Spizzirri, P., Stavrias, N. & Prawer, S. (2008). Far-infrared spectroscopy of P ion-implanted Si. Proceedings of the Australian Institute of Physics 18th National Congress (pp. 96-99). Australia: Australian Institute of Physics.

Pagination

96-99

Language

English

RIS ID

24747

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