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Estimating the parameters of semiconductor lasers based on weak optical feedback interferometry

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conference contribution
posted on 2024-11-14, 10:27 authored by Jiangtao XiJiangtao Xi, Yanguang YuYanguang Yu, Jose ChicharoJose Chicharo, Thierry Bosch
The paper presents a new approach for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SL) and the optical feedback level factor C in SLs. The proposed approach is based on the analysis of self-mixing signals observed in self-mixing optical feedback interferometry. Unlike existing approaches, the approach tries to estimate the parameters LEF and C by a gradient-based optimization algorithm that achieves best data-to-theoretical model fitting. The effectiveness and accuracy of the method have been confirmed and tested by theoretical analysis and computer simulations.

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Citation

Xi, J., Yu, Y., Chicharo, J. F. & Bosch, T. (2005). Estimating the Parameters of Semiconductor Lasers Based on Weak Optical Feedback Interferometry. In A. Rakic & Y. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices COMMAD04 Proceedings (pp. 401-404). USA: IEEE.

Parent title

Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

Pagination

401-404

Language

English

RIS ID

13264

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