The paper presents a new approach for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SL) and the optical feedback level factor C in SLs. The proposed approach is based on the analysis of self-mixing signals observed in self-mixing optical feedback interferometry. Unlike existing approaches, the approach tries to estimate the parameters LEF and C by a gradient-based optimization algorithm that achieves best data-to-theoretical model fitting. The effectiveness and accuracy of the method have been confirmed and tested by theoretical analysis and computer simulations.
History
Citation
Xi, J., Yu, Y., Chicharo, J. F. & Bosch, T. (2005). Estimating the Parameters of Semiconductor Lasers Based on Weak Optical Feedback Interferometry. In A. Rakic & Y. Yeow (Eds.), 2004 Conference on Optoelectronic and Microelectronic Materials and Devices COMMAD04 Proceedings (pp. 401-404). USA: IEEE.
Parent title
Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD