Material characterization at low frequencies using THz and Raman spectroscopy

Authors

Y Kutuvantavida, Massey University
G V M Williams, Victoria University of Wellington
E M. Pogson, University of WollongongFollow
D Bhuiyan, Industrial Research Limited
K Radhanpura, University of WollongongFollow
Roger A. Lewis, University of WollongongFollow

RIS ID

75377

Publication Details

Kutuvantavida, Y., Williams, G. V M., Pogson, E. M., Bhuiyan, D., Radhanpura, K. & Lewis, R. A. (2012). Material characterization at low frequencies using THz and Raman spectroscopy. 37th IRMMW-THz: International Conference on Infrared, Millimeter, and Terahertz Waves (pp. 1-3). IEEE Xplore: IEEE.

Abstract

We present results from wideband THz, low wave-number Raman, and FTIR measurements on benzoic acid and two of its derivatives. The low energy vibrational modes have been identified and compared with the results from calculations.