Surface engineering with Ar+/O2+ ion beam bombardment: Tuning the electronic and magnetic behavior of Ni80Fe20/La0.7Sr0.3MnO3/SrTiO3(001) junctions

Authors

I Bergenti, Institute of Nanostructured Materials
Palash K. Manna, University of Manitoba
C H. Lin, National Chung Hsing University, Taiwan
P Graziosi, Institute of Nanostructured Materials
X Liu, Australian Nuclear Science And Technology Organisation
Grace L. Causer, University of WollongongFollow
F Liscio, National Research Council of Italy
A Ruotolo, City University of Hong Kong
V A. Dediu, Institute of Nanostructured Materials
Johan Van Lierop, University of Manitoba
Frank Klose, Australian Nuclear Science And Technology OrganisationFollow
Ko-Wei Lin, National Chung Hsing University, TaiwanFollow

RIS ID

131842

Publication Details

Bergenti, I., Manna, P. K., Lin, C. H., Graziosi, P., Liu, X., Causer, G. L., Liscio, F., Ruotolo, A., Dediu, V. A., van Lierop, J., Klose, F. & Lin, K. W. (2018). Surface engineering with Ar+/O2+ ion beam bombardment: Tuning the electronic and magnetic behavior of Ni80Fe20/La0.7Sr0.3MnO3/SrTiO3(001) junctions. Journal of Applied Physics, 124 (18), 183903-1-183903-1.

Abstract

The magnetic and magnetotransport properties of Ni80Fe20/La0.7Sr0.3MnO3 (NiFe/LSMO) bilayers were investigated after bombarding the LSMO surface with low-energy Ar+ or O2+/Ar+ ion beams before the growth of the top NiFe layer. A variety of magnetic properties are revealed, including an asymmetric two-stepped hysteresis loop with an exchange bias loop shift, and alternatively, a symmetric two-stepped hysteresis loop with an enhanced coercivity. Polarized neutron reflectometry measurements provide details of the magnetic depth profile and interface layer magnetism at different temperatures. The LSMO surface modifications determine a complex magnetic and electric NiFe/LSMO interface having a strong effect on the magnetoresistance of the bilayer. Surface engineering based on ion beam bombardment is presented as a promising technique for optimizing the electronic and magnetic properties of NiFe/LSMO junctions for future device applications.