RIS ID

111585

Publication Details

Bertinshaw, J., Bruck, S., Lott, D., Fritzsche, H., Khaydukov, Y., Soltwedel, O., Keller, T., Goering, E., Audehm, P., Cortie, D. L., Hutchison, W. D., Ramasse, Q. M., Arredondo, M., Maran, R., Nagarajan, V., Klose, F. & Ulrich, C. (2014). Element-specific depth profile of magnetism and stoichiometry at the La0.67Sr0.33MnO3/BiFeO3 interface. Physical Review B: Condensed Matter and Materials Physics, 90 (4), 041113-1-041113-5.

Abstract

Depth-sensitive magnetic, structural, and chemical characterization is important in the understanding and optimization of physical phenomena emerging at the interfaces of transition metal oxide heterostructures. In a simultaneous approach we have used polarized neutron and resonant x-ray reflectometry to determine the magnetic profile across atomically sharp interfaces of ferromagnetic La0.67Sr0.33MnO3/multiferroic BiFeO3 bilayers with subnanometer resolution. In particular, the x-ray resonant magnetic reflectivity measurements at the Fe and Mn resonance edges allowed us to determine the element-specific depth profile of the ferromagnetic moments in both the La0.67Sr0.33MnO3 and BiFeO3 layers. Our measurements indicate a magnetically diluted interface layer within the La0.67Sr0.33MnO3 layer, in contrast to previous observations on inversely deposited layers [P. Yu, Phys. Rev. Lett. 105, 027201 (2010)PRLTAO0031-900710.1103/PhysRevLett.105.027201]. Additional resonant x-ray reflection measurements indicate a region of altered Mn and O content at the interface, with a thickness matching that of the magnetic diluted layer, as the origin of the reduction of the magnetic moment. 2014 American Physical Society.

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Link to publisher version (DOI)

http://dx.doi.org/10.1103/PhysRevB.90.041113