Title

Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films

RIS ID

24928

Publication Details

Ionescu, M., Zhao, Y., Siegele, R., Cohen, D. D., Stelcer, E. & Prior, M. (2008). Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 266 (8), 1701-1704.

Abstract

Oxygen incorporation in MgB2 thin films during their fabrication process has a strong influence on the future properties of the films, and was studied by Elastic Recoil Detection Analysis with Heavy ions and a Time-of-flight detection. A series of MgB2 thin film samples were analyzed, including films produced in situ on Al2O3-C and Si (0 0 1) substrates (with higher T-c and lower T-c) with an "on-axis" geometry, and films produced in situ with an "off-axis" geometry. The amount of oxygen detected in these films appears to be correlated with the T-c of the films, the higher the T-c the lower the oxygen content. The superconducting properties of the examined thin films are discussed in the context of the ERDA results. (C) 2008 Elsevier B.V. All rights reserved.

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Link to publisher version (DOI)

http://dx.doi.org/10.1016/j.nimb.2008.01.033