Quantitative description of critical current density in YBCO films and multilayers

Authors

Alexey V. Pan, University of WollongongFollow
Serhiy Pysarenko, University of WollongongFollow
S X. Dou, University of WollongongFollow

RIS ID

31533

Publication Details

Pan, A. V., Pysarenko, S. Dou, S. Xue. (2009). Quantitative description of critical current density in YBCO films and multilayers. IEEE Transactions on Applied Superconductivity, 19 (3), 3391-3394.

Abstract

The vortex pinning model based on the presence of the large number of edge dislocations in high quality YBa₂Cu₃O₇ (YBCO) films and multilayers has been refined. By introducing the pinning potential of a chain of individual edge dislocations, we have been able not only to describe the critical current density dependence on the applied magnetic field over its entire range, but also to extract the microstructural parameters in the films, such as inter-dislocation spacing and average domain size, without employing sophisticated microstructural analysis. The model applicability and its results have been verified with the help of microstructural characterization combined with magneto-optical imaging in YBCO films and multilayers with different properties.

Grant Number

ARC/DP0770205

Additional Grant Number

http://purl.org/au-research/grants/ARC/DP0770205