Title

Terahertz magnetospectroscopy of heavily-doped Si(P)

RIS ID

27663

Publication Details

Lewis, R. A. Vickers, R. E. (2009). Terahertz magnetospectroscopy of heavily-doped Si(P). International Journal of Modern Physics B, 23 2856-2860.

Abstract

We demonstrate that lightly-doped Si(P) displays extremely sharp absorption lines – the narrowest yet reported for any impurity in natural Si. The Zeeman splitting of many of these lines in magnetic fields <10 T has been studied previously by a number of groups. In this paper we focus on the behavior of metastable states associated with conduction-band Landau levels. The use of a rather heavily doped sample and strong magnetic fields, up to 18 T, assists in the observation of these.

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Link to publisher version (DOI)

http://dx.doi.org/10.1142/S0217979209062451