SOI Thin Microdosimeter Detectors for Low Energy Ions and Radiation Damage Studies

Authors

Benjamin James, University of WollongongFollow
Linh T. Tran, University of WollongongFollow
James Vohradsky, University of WollongongFollow
David Bolst, University of WollongongFollow
Vladimir Pan, University of Wollongong
Madeline Carr, University of Wollongong
Susanna Guatelli, University of WollongongFollow
Alex Pogossov, University of Wollongong
Marco Petasecca, University of WollongongFollow
Michael L. F Lerch, University of WollongongFollow
Dale A. Prokopovich, University of WollongongFollow
Mark I. Reinhard, ANSTO
Marco Povoli, University of Oslo
Angela Kok, SINTEFFollow
David Hinde, Australian National UniversityFollow
Mahananda Dasgupta, Australian National University
Andrew Stuchbery, Australian National University
Vladimir Perevertaylo, SPA BIT
Anatoly B. Rosenfeld, University of WollongongFollow

RIS ID

132423

Publication Details

James, B., Tran, L. T., Vohradsky, J., Bolst, D., Pan, V., Carr, M., Guatelli, S., Pogossov, A., Petasecca, M., Lerch, M., Prokopovich, D. A., Reinhard, M. I., Povoli, M., Kok, A., Hinde, D., Dasgupta, M., Stuchbery, A., Perevertaylo, V. & Rosenfeld, A. B. (2019). SOI Thin Microdosimeter Detectors for Low Energy Ions and Radiation Damage Studies. IEEE Transactions on Nuclear Science, 66 (1), 320-326.

Abstract

The responses of two silicon on insulator (SOI) 3-D microdosimeters developed by the Centre for Medical Radiation Physics were investigated with a range of different low energy ions, with high linear energy transfer (LET). The two microdosimeters n-SOI and p-SOI were able to measure the LET of different ions including ⁷ Li, ¹² C, ¹⁶ O, and ⁴⁸ Ti with ranges below 350 μm in silicon. No plasma effects were seen in the SOI microdosimeters when irradiated with the high LET ions. A Monte Carlo simulation using Geant4 was compared to the experimental measurements, whereby some discrepancies were observed for heavier ions at lower energies. This discrepancy can be partly attributed to uncertainties in the thickness of the energy degraders and overlayers of the devices. The microdosimetric measurements of low energy ¹⁶ O ions were obtained and compared to a therapeutic ¹⁶ O ion beam. The radiation hardness of the two devices was studied using the ion beam induced charge collection technique. Both types of the microdosimeters when biased had no essential changes in charge collection efficiency in the sensitive volume after irradiation with low energy ions.

Grant Number

ARC/DP170102273