Publication Details

Wang, Z. M., Cai, Z. L., Zhao, K., Guo, X. L., Chen, J., Sun, W., Cheng, Z. X., Kimura, H., Li, B., Yuan, G. L., Yin, J. and Liu, Z. G. (2013). In-situ observation of nanomechanical behavior arising from critical-temperature-induced phase transformation in Ba(Zr0.2Ti 0.8)O3-0.5(Ba0.7Ca0.3)TiO 3 thin film. Applied Physics Letters, 103 (7), 071902-1-071902-4.


In this Letter, we use the nanoindentation technique and vary the testing temperature to above and below critical values to study the nanomechanical features of a strong Pb-free piezoelectric Ba(Zr0.2Ti 0.8)O3-0.5(Ba0.7Ca0.3)TiO 3 (BZT-0.5BCT) thin film across its piezoelectric-optimal morphotropic phase boundary. The mechanisms responsible for the Young's modulus and hardness evolution are then discussed. An X-ray diffraction method that can detect the d(110) variation associated with the change in the inclination angle ψ of the (110) plane was developed to quantify the residual stress in the BZT-0.5BCT films.



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